|
10: State of the Art in Modeling
and Measuring of Surface Reflection
Sunday, Half Day, 1:30 - 5 pm
Room 511
Surface
appearance is at the heart of computer graphics. At the
lowest level, it is controlled by the surface bi-directional
reflectance distribution function (BRDF), which describes
how much light incident from a given direction is being
scattered in another direction. Both measuring and modeling
of this function have a long history, and active research
is continuing. The main goal of the course is to provide
a snapshot of the most recent results from the computer
graphics community.
Prerequisites
Familiarity with BRDF formalism and currently used reflection
models. Good understanding of the basic physics of light-surface
interaction and the fundamental principles of both geometric
and wave optics.
Topics
Fundamentals and different types of simple reflectance
measurements. Traditional and image-based BRDF measurement
techniques. Reflection models based on the wave theory
of light. Models that account for subsurface scattering.
The microfacet theory of surface reflectance. Recent empirical
models.
Organizer
Michael Ashikhmin
University of Utah
Lecturers
Michael Ashikhmin
Peter Shirley
University of Utah
Steve Marschner
Stanford University
Jos Stam
Alias|Wavefront |
|
